Capabilities
SI-1000 platform
Machine Vision & Surface Inspection
High-speed defect detection for production lines, using a high signal-to-noise linear CCD and adjustable illumination to catch flaws on paper, circuit boards, and LCD filters in real time.
How the SI-1000 platform works
The SI-1000 pairs a high signal-to-noise linear CCD with adjustable illumination, tuned to the material being inspected, so surface defects are flagged in real time as material moves through the line rather than caught after the fact in a separate quality-control step.
Where it’s deployed
HIT has built machine vision inspection for paper, circuit board, and LCD filter production — spanning industrial assembly systems, consumer electronics, and commercial print equipment, wherever a surface flaw needs to be caught before it reaches the next stage of production.
Built on the same precision discipline
The SI-1000 platform draws on the same optical engineering discipline behind HIT’s imaging systems — it’s the same discipline behind every system we build, applied here to detecting defects instead of exposing plates.
Frequently asked questions
- What defects can the SI-1000 platform detect?
- The SI-1000 uses a high signal-to-noise linear CCD and adjustable illumination to catch surface flaws in real time as material moves through a production line.
- What materials or products can be inspected with HIT’s machine vision systems?
- HIT has built machine vision inspection for paper, circuit boards, and LCD filters, and the SI-1000 platform is adaptable to other surfaces where defect detection is needed on a production line.
- Is this designed to run inline on an active production line?
- Yes. The SI-1000 is built for real-time, high-speed defect detection as material moves through the line, rather than as an offline sampling step.